unit test for combined device state mapping and device to exten state mapping
authorDavid Vossel <dvossel@digium.com>
Wed, 17 Feb 2010 19:18:44 +0000 (19:18 +0000)
committerDavid Vossel <dvossel@digium.com>
Wed, 17 Feb 2010 19:18:44 +0000 (19:18 +0000)
commit5b0b04f2d8d7c6814b8df38eac93b28e2dbb6143
tree0e16539250f85aa214c933d28f03e88786c502cf
parent57c819fd5eac60f965b50877161be4c1b3ba2dab
unit test for combined device state mapping and device to exten state mapping

Review: https://reviewboard.asterisk.org/r/516/

git-svn-id: https://origsvn.digium.com/svn/asterisk/trunk@247262 65c4cc65-6c06-0410-ace0-fbb531ad65f3
tests/test_devicestate.c [new file with mode: 0644]